Layer thickness dependence of the current-induced effective field vector in Ta|CoFeB|MgO.

Kim, Junyeon

Layer thickness dependence of the current-induced effective field vector in Ta|CoFeB|MgO. [electronic resource] - Nature materials Mar 2013 - 240-5 p. digital

Publication Type: Journal Article

ISSN: 1476-4660

Standard No.: 10.1038/nmat3522 doi

Layer thickness dependence of the current-induced effective field vector in Ta|CoFeB|MgO.

APA

Kim J., Sinha J., Hayashi M., Yamanouchi M., Fukami S., Suzuki T., Mitani S. & Ohno H. (20130426). Layer thickness dependence of the current-induced effective field vector in Ta|CoFeB|MgO. : Nature materials.

Chicago

Kim Junyeon, Sinha Jaivardhan, Hayashi Masamitsu, Yamanouchi Michihiko, Fukami Shunsuke, Suzuki Tetsuhiro, Mitani Seiji and Ohno Hideo. 20130426. Layer thickness dependence of the current-induced effective field vector in Ta|CoFeB|MgO. : Nature materials.

Harvard

Kim J., Sinha J., Hayashi M., Yamanouchi M., Fukami S., Suzuki T., Mitani S. and Ohno H. (20130426). Layer thickness dependence of the current-induced effective field vector in Ta|CoFeB|MgO. : Nature materials.

MLA

Kim Junyeon, Sinha Jaivardhan, Hayashi Masamitsu, Yamanouchi Michihiko, Fukami Shunsuke, Suzuki Tetsuhiro, Mitani Seiji and Ohno Hideo. Layer thickness dependence of the current-induced effective field vector in Ta|CoFeB|MgO. : Nature materials. 20130426.

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