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Application of white-light scanning interferometer on transparent thin-film measurement.

Li, Meng-Chi

Application of white-light scanning interferometer on transparent thin-film measurement. [electronic resource] - Applied optics Dec 2012 - 8579-86 p. digital

Publication Type: Journal Article

ISSN: 1539-4522

Standard No.: 10.1364/AO.51.008579 doi

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