Note: grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry.

Körstgens, V

Note: grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry. [electronic resource] - The Review of scientific instruments Jul 2012 - 076107 p. digital

Publication Type: Journal Article

ISSN: 1089-7623

Standard No.: 10.1063/1.4738880 doi

Note: grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry.

APA

Körstgens V., Meier R., Ruderer M. A., Guo S., Chiang H., Perlich J., Roth S. V., Gehrke R. & Müller-Buschbaum P. (20121113). Note: grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry. : The Review of scientific instruments.

Chicago

Körstgens V, Meier R, Ruderer M A, Guo S, Chiang H-Y, Perlich J, Roth S V, Gehrke R and Müller-Buschbaum P. 20121113. Note: grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry. : The Review of scientific instruments.

Harvard

Körstgens V., Meier R., Ruderer M. A., Guo S., Chiang H., Perlich J., Roth S. V., Gehrke R. and Müller-Buschbaum P. (20121113). Note: grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry. : The Review of scientific instruments.

MLA

Körstgens V, Meier R, Ruderer M A, Guo S, Chiang H-Y, Perlich J, Roth S V, Gehrke R and Müller-Buschbaum P. Note: grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry. : The Review of scientific instruments. 20121113.

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