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Resolution determination in X-ray microscopy: an analysis of the effects of partial coherence and illumination spectrum.

Heck, J M

Resolution determination in X-ray microscopy: an analysis of the effects of partial coherence and illumination spectrum. [electronic resource] - Journal of X-ray science and technology Jan 1998 - 95-104 p. digital

Publication Type: Journal Article

ISSN: 0895-3996

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