Single-electron capacitance spectroscopy of individual dopants in silicon.
Gasseller, M
Single-electron capacitance spectroscopy of individual dopants in silicon. [electronic resource] - Nano letters Dec 2011 - 5208-12 p. digital
Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.
1530-6992
10.1021/nl2025163 doi
Single-electron capacitance spectroscopy of individual dopants in silicon. [electronic resource] - Nano letters Dec 2011 - 5208-12 p. digital
Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.
1530-6992
10.1021/nl2025163 doi