Complementary characterization of buried nanolayers by quantitative X-ray fluorescence spectrometry under conventional and grazing incidence conditions.

Unterumsberger, Rainer

Complementary characterization of buried nanolayers by quantitative X-ray fluorescence spectrometry under conventional and grazing incidence conditions. [electronic resource] - Analytical chemistry Nov 2011 - 8623-8 p. digital

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

1520-6882

10.1021/ac202074s doi


Boron--chemistry
Carbon--chemistry
Nanostructures--chemistry
Spectrometry, X-Ray Emission