High precision measurements of atom column positions using model-based exit wave reconstruction.

De Backer, A

High precision measurements of atom column positions using model-based exit wave reconstruction. [electronic resource] - Ultramicroscopy - 1475-82 p. digital

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

1879-2723

10.1016/j.ultramic.2011.07.002 doi


Computer Simulation
Image Processing, Computer-Assisted--methods
Likelihood Functions
Microscopy, Electron, Transmission--statistics & numerical data
Models, Theoretical