Normal view MARC view ISBD view

Ion beam nanopatterning in graphite: characterization of single extended defects.

Mélinon, P

Ion beam nanopatterning in graphite: characterization of single extended defects. [electronic resource] - Nanotechnology Jun 2008 - 235305 p. digital

Publication Type: Journal Article

ISSN: 0957-4484

Standard No.: 10.1088/0957-4484/19/23/235305 doi

Print
Cite
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)