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Characterization of crystalline structure and morphology of NiO thin films.

Shin, Hyemin

Characterization of crystalline structure and morphology of NiO thin films. [electronic resource] - Journal of nanoscience and nanotechnology May 2011 - 4629-32 p. digital

Publication Type: Journal Article

ISSN: 1533-4880

Standard No.: 10.1166/jnn.2011.3690 doi

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