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Probe-sample interactions in reflection near-field scanning optical microscopy.

Cline, J A

Probe-sample interactions in reflection near-field scanning optical microscopy. [electronic resource] - Applied optics Aug 1995 - 4869-76 p. digital

Publication Type: Journal Article

ISSN: 1559-128X

Standard No.: 10.1364/AO.34.004869 doi

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