Correlating defect density with carrier mobility in large-scaled graphene films: Raman spectral signatures for the estimation of defect density.

Hwang, Jeong-Yuan

Correlating defect density with carrier mobility in large-scaled graphene films: Raman spectral signatures for the estimation of defect density. [electronic resource] - Nanotechnology Nov 2010 - 465705 p. digital

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

1361-6528

10.1088/0957-4484/21/46/465705 doi