High-accuracy profiler that uses depth from focus.
Fieguth, P W
High-accuracy profiler that uses depth from focus. [electronic resource] - Applied optics Feb 1994 - 686-9 p. digital
Publication Type: Journal Article
1559-128X
10.1364/AO.33.000686 doi
High-accuracy profiler that uses depth from focus. [electronic resource] - Applied optics Feb 1994 - 686-9 p. digital
Publication Type: Journal Article
1559-128X
10.1364/AO.33.000686 doi