Clustering and local magnification effects in atom probe tomography: a statistical approach.

Philippe, Thomas

Clustering and local magnification effects in atom probe tomography: a statistical approach. [electronic resource] - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Oct 2010 - 643-8 p. digital

Publication Type: Journal Article

1435-8115

10.1017/S1431927610000449 doi