APA
Schmidt T., Marchetto H., Lévesque P. L., Groh U., Maier F., Preikszas D., Hartel P., Spehr R., Lilienkamp G., Engel W., Fink R., Bauer E., Rose H., Umbach E. & Freund H. (20101217). Double aberration correction in a low-energy electron microscope. : Ultramicroscopy.
Chicago
Schmidt Th, Marchetto H, Lévesque P L, Groh U, Maier F, Preikszas D, Hartel P, Spehr R, Lilienkamp G, Engel W, Fink R, Bauer E, Rose H, Umbach E and Freund H-J. 20101217. Double aberration correction in a low-energy electron microscope. : Ultramicroscopy.
Harvard
Schmidt T., Marchetto H., Lévesque P. L., Groh U., Maier F., Preikszas D., Hartel P., Spehr R., Lilienkamp G., Engel W., Fink R., Bauer E., Rose H., Umbach E. and Freund H. (20101217). Double aberration correction in a low-energy electron microscope. : Ultramicroscopy.
MLA
Schmidt Th, Marchetto H, Lévesque P L, Groh U, Maier F, Preikszas D, Hartel P, Spehr R, Lilienkamp G, Engel W, Fink R, Bauer E, Rose H, Umbach E and Freund H-J. Double aberration correction in a low-energy electron microscope. : Ultramicroscopy. 20101217.