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Refractive-index measurements of moderately reflecting substrates using a wedged film technique.

Beauchamp, W T

Refractive-index measurements of moderately reflecting substrates using a wedged film technique. [electronic resource] - Applied optics Sep 1980 - 3239-44 p. digital

Publication Type: Journal Article

ISSN: 1559-128X

Standard No.: 10.1364/AO.19.003239 doi

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