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Combined reflection and transmission thin-film ellipsometry: a unified linear analysis.

Azzam, R M

Combined reflection and transmission thin-film ellipsometry: a unified linear analysis. [electronic resource] - Applied optics Jul 1975 - 1652-63 p. digital

Publication Type: Journal Article

ISSN: 1559-128X

Standard No.: 10.1364/AO.14.001652 doi

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