SESAM: exploring the frontiers of electron microscopy.

Koch, Christoph T

SESAM: exploring the frontiers of electron microscopy. [electronic resource] - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Dec 2006 - 506-14 p. digital

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

1431-9276

10.1017/s1431927606060624 doi