Optical monitoring and real time admittance loci calculation through polarization interferometer.

Lee, Cheng-Chung

Optical monitoring and real time admittance loci calculation through polarization interferometer. [electronic resource] - Optics express Dec 2007 - 17536-41 p. digital

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

1094-4087

10.1364/oe.15.017536 doi


Computer-Aided Design
Equipment Design
Equipment Failure Analysis
Interferometry--instrumentation
Light
Materials Testing--methods
Membranes, Artificial
Refractometry--instrumentation
Reproducibility of Results
Scattering, Radiation
Sensitivity and Specificity