APA

Dapor M., Jepson M. A. E., Inkson B. J. & Rodenburg C. (20090701). The effect of oxide overlayers on secondary electron dopant mapping. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

Chicago

Dapor Maurizio, Jepson Mark A E, Inkson Beverley J and Rodenburg Cornelia. 20090701. The effect of oxide overlayers on secondary electron dopant mapping. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

Harvard

Dapor M., Jepson M. A. E., Inkson B. J. and Rodenburg C. (20090701). The effect of oxide overlayers on secondary electron dopant mapping. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

MLA

Dapor Maurizio, Jepson Mark A E, Inkson Beverley J and Rodenburg Cornelia. The effect of oxide overlayers on secondary electron dopant mapping. : Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20090701.