Four-probe electrical-transport measurements on single indium tin oxide nanowires between 1.5 and 300 K.

Chiu, Shao-Pin

Four-probe electrical-transport measurements on single indium tin oxide nanowires between 1.5 and 300 K. [electronic resource] - Nanotechnology Mar 2009 - 105203 p. digital

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

1361-6528

10.1088/0957-4484/20/10/105203 doi


Crystallization--methods
Electric Impedance
Electron Transport
Macromolecular Substances--chemistry
Materials Testing--methods
Molecular Conformation
Nanostructures--chemistry
Nanotechnology--methods
Particle Size
Surface Properties
Temperature
Tin Compounds--chemistry