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Highly reliable carbon nanotube transistors with patterned gates and molecular gate dielectric.

Weitz, R Thomas

Highly reliable carbon nanotube transistors with patterned gates and molecular gate dielectric. [electronic resource] - Nano letters Apr 2009 - 1335-40 p. digital

Publication Type: Journal Article

ISSN: 1530-6992

Standard No.: 10.1021/nl802982m doi

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