Low-Power Testing of Losses in Millimeter-Wave Transmission Lines for High-Power Applications.

Han, S T

Low-Power Testing of Losses in Millimeter-Wave Transmission Lines for High-Power Applications. [electronic resource] - International journal of infrared and millimeter waves Nov 2008 - 1011-1018 p. digital

Publication Type: Journal Article

0195-9271

10.1007/s10762-008-9404-3 doi