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Characterization of nanoscale recording mark on Ge2Sb2Te5 film.

Kim, JunHo

Characterization of nanoscale recording mark on Ge2Sb2Te5 film. [electronic resource] - Ultramicroscopy Sep 2008 - 1246-50 p. digital

Publication Type: Journal Article

ISSN: 0304-3991

Standard No.: 10.1016/j.ultramic.2008.04.080 doi

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