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Optical properties and bandgaps from low loss EELS: pitfalls and solutions.

Stöger-Pollach, M

Optical properties and bandgaps from low loss EELS: pitfalls and solutions. [electronic resource] - Micron (Oxford, England : 1993) Dec 2008 - 1092-110 p. digital

Publication Type: Journal Article

ISSN: 0968-4328

Standard No.: 10.1016/j.micron.2008.01.023 doi

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