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Measuring refractive index and thickness of thin films: a new technique.

Ding, T N

Measuring refractive index and thickness of thin films: a new technique. [electronic resource] - Applied optics Oct 1983 - 3177 p. digital

Publication Type: Journal Article

ISSN: 1559-128X

Standard No.: 10.1364/ao.22.003177 doi

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