Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary.

Pérez-Willard, Fabián

Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary. [electronic resource] - Micron (Oxford, England : 1993) 2008 - 45-52 p. digital

Publication Type: Journal Article

0968-4328

10.1016/j.micron.2007.01.001 doi