In situ x-ray photoelectron spectroscopic and density-functional studies of Si atoms adsorbed on a C60 film.
Onoe, Jun
In situ x-ray photoelectron spectroscopic and density-functional studies of Si atoms adsorbed on a C60 film. [electronic resource] - The Journal of chemical physics Dec 2004 - 11351-7 p. digital
Publication Type: Journal Article
0021-9606
10.1063/1.1814053 doi
In situ x-ray photoelectron spectroscopic and density-functional studies of Si atoms adsorbed on a C60 film. [electronic resource] - The Journal of chemical physics Dec 2004 - 11351-7 p. digital
Publication Type: Journal Article
0021-9606
10.1063/1.1814053 doi