Characterization of substrates for use in X-ray multilayer optics.

Lodha, G S

Characterization of substrates for use in X-ray multilayer optics. [electronic resource] - Journal of synchrotron radiation May 1998 - 693-5 p. digital

Publication Type: Journal Article

ISSN: 0909-0495

Standard No.: 10.1107/S0909049598000958 doi

Characterization of substrates for use in X-ray multilayer optics.

APA

Lodha G. S., Yamashita K., Haga K., Kunieda H., Nakajo N., Nakamura N., Tamura K., Tawara Y., Bennett J. M., Yu J. & Namba Y. (20121002). Characterization of substrates for use in X-ray multilayer optics. : Journal of synchrotron radiation.

Chicago

Lodha G S, Yamashita K, Haga K, Kunieda H, Nakajo N, Nakamura N, Tamura K, Tawara Y, Bennett J M, Yu J and Namba Y. 20121002. Characterization of substrates for use in X-ray multilayer optics. : Journal of synchrotron radiation.

Harvard

Lodha G. S., Yamashita K., Haga K., Kunieda H., Nakajo N., Nakamura N., Tamura K., Tawara Y., Bennett J. M., Yu J. and Namba Y. (20121002). Characterization of substrates for use in X-ray multilayer optics. : Journal of synchrotron radiation.

MLA

Lodha G S, Yamashita K, Haga K, Kunieda H, Nakajo N, Nakamura N, Tamura K, Tawara Y, Bennett J M, Yu J and Namba Y. Characterization of substrates for use in X-ray multilayer optics. : Journal of synchrotron radiation. 20121002.

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