Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy.

Johnson, S L

Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy. [electronic resource] - Physical review letters Oct 2003 - 157403 p. digital

Publication Type: Journal Article

ISSN: 0031-9007

Standard No.: 10.1103/PhysRevLett.91.157403 doi

Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy.

APA

Johnson S. L., Heimann P. A., Lindenberg A. M., Jeschke H. O., Garcia M. E., Chang Z., Lee R. W., Rehr J. J. & Falcone R. W. (20031217). Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy. : Physical review letters.

Chicago

Johnson S L, Heimann P A, Lindenberg A M, Jeschke H O, Garcia M E, Chang Z, Lee R W, Rehr J J and Falcone R W. 20031217. Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy. : Physical review letters.

Harvard

Johnson S. L., Heimann P. A., Lindenberg A. M., Jeschke H. O., Garcia M. E., Chang Z., Lee R. W., Rehr J. J. and Falcone R. W. (20031217). Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy. : Physical review letters.

MLA

Johnson S L, Heimann P A, Lindenberg A M, Jeschke H O, Garcia M E, Chang Z, Lee R W, Rehr J J and Falcone R W. Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy. : Physical review letters. 20031217.

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