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High-resolution imaging with an aberration-corrected transmission electron microscope.

Lentzen, M

High-resolution imaging with an aberration-corrected transmission electron microscope. [electronic resource] - Ultramicroscopy Aug 2002 - 233-42 p. digital

Publication Type: Journal Article

ISSN: 0304-3991

Standard No.: 10.1016/s0304-3991(02)00139-0 doi

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