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Mechanism for the enhanced diffusion of charged oxygen ions in SiO2.

Jin, Y G

Mechanism for the enhanced diffusion of charged oxygen ions in SiO2. [electronic resource] - Physical review letters Feb 2001 - 1793-6 p. digital

Publication Type: Journal Article

ISSN: 0031-9007

Standard No.: 10.1103/PhysRevLett.86.1793 doi

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