APA

English R. D., Van Stipdonk M. J., Diehnelt C. W. & Schweikert E. A. (20010628). Influence of constituent mass on secondary ion yield enhancements from polyatomic ion impacts on aminoethanethiol self-assembled monolayer surfaces. : Rapid communications in mass spectrometry : RCM.

Chicago

English R D, Van Stipdonk M J, Diehnelt C W and Schweikert E A. 20010628. Influence of constituent mass on secondary ion yield enhancements from polyatomic ion impacts on aminoethanethiol self-assembled monolayer surfaces. : Rapid communications in mass spectrometry : RCM.

Harvard

English R. D., Van Stipdonk M. J., Diehnelt C. W. and Schweikert E. A. (20010628). Influence of constituent mass on secondary ion yield enhancements from polyatomic ion impacts on aminoethanethiol self-assembled monolayer surfaces. : Rapid communications in mass spectrometry : RCM.

MLA

English R D, Van Stipdonk M J, Diehnelt C W and Schweikert E A. Influence of constituent mass on secondary ion yield enhancements from polyatomic ion impacts on aminoethanethiol self-assembled monolayer surfaces. : Rapid communications in mass spectrometry : RCM. 20010628.