Relatedness of the incidence decay with exponential adjustment (IDEA) model, "Farr's law" and SIR compartmental difference equation models.

Name: Relatedness of the incidence decay with exponential adjustment (IDEA) model, "Farr's law" and SIR compartmental difference equation models.
Author: Santillana, Mauricio

Relatedness of the incidence decay with exponential adjustment (IDEA) model, "Farr's law" and SIR compartmental difference equation models. — المؤلف: Santillana, Mauricio — Infectious Disease Modelling 2018

المؤلف: Santillana, Mauricio
النشر: Infectious Disease Modelling 2018
الوصف: 1-12 p.