Overcoming diffusion-related limitations in semiconductor defect imaging with phonon-plasmon-coupled mode Raman scattering.

Name: Overcoming diffusion-related limitations in semiconductor defect imaging with phonon-plasmon-coupled mode Raman scattering.
Author: Hu, Changkui

Overcoming diffusion-related limitations in semiconductor defect imaging with phonon-plasmon-coupled mode Raman scattering. — المؤلف: Hu, Changkui — Light, science & applications 2018

المؤلف: Hu, Changkui
النشر: Light, science & applications 2018
الوصف: 23 p.