X-ray reflectivity and diffuse-scattering study of CoSi2 layers in Si produced by ion-beam synthesis. [electronic resource]

Publication details: Physical review. B, Condensed matter Feb 1993Description: 4385-4393 p. digitalISSN:
  • 0163-1829
Online resources: In: Physical review. B, Condensed matter vol. 47
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Publication Type: Journal Article

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