Current Understanding of the Fundamental Mechanisms of Doped and Loaded Semiconducting Metal-Oxide-Based Gas Sensing Materials. [electronic resource]

By: Contributor(s): Producer: 20200715Description: 2228-2249 p. digitalISSN:
  • 2379-3694
Subject(s): Online resources: In: ACS sensors vol. 4
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Publication Type: Journal Article; Review

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