APA

Hill M. O., Calvo-Almazan I., Allain M., Holt M. V., Ulvestad A., Treu J., Koblmüller G., Huang C., Huang X., Yan H., Nazaretski E., Chu Y. S., Stephenson G. B., Chamard V., Lauhon L. J. & Hruszkewycz S. O. (20181023). Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography. : Nano letters.

Chicago

Hill Megan O, Calvo-Almazan Irene, Allain Marc, Holt Martin V, Ulvestad Andrew, Treu Julian, Koblmüller Gregor, Huang Chunyi, Huang Xiaojing, Yan Hanfei, Nazaretski Evgeny, Chu Yong S, Stephenson G Brian, Chamard Virginie, Lauhon Lincoln J and Hruszkewycz Stephan O. 20181023. Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography. : Nano letters.

Harvard

Hill M. O., Calvo-Almazan I., Allain M., Holt M. V., Ulvestad A., Treu J., Koblmüller G., Huang C., Huang X., Yan H., Nazaretski E., Chu Y. S., Stephenson G. B., Chamard V., Lauhon L. J. and Hruszkewycz S. O. (20181023). Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography. : Nano letters.

MLA

Hill Megan O, Calvo-Almazan Irene, Allain Marc, Holt Martin V, Ulvestad Andrew, Treu Julian, Koblmüller Gregor, Huang Chunyi, Huang Xiaojing, Yan Hanfei, Nazaretski Evgeny, Chu Yong S, Stephenson G Brian, Chamard Virginie, Lauhon Lincoln J and Hruszkewycz Stephan O. Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography. : Nano letters. 20181023.