APA

Martinez G. T., De Backer A., Rosenauer A., Verbeeck J. & Van Aert S. (20150330). The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images. : Micron (Oxford, England : 1993).

Chicago

Martinez G T, De Backer A, Rosenauer A, Verbeeck J and Van Aert S. 20150330. The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images. : Micron (Oxford, England : 1993).

Harvard

Martinez G. T., De Backer A., Rosenauer A., Verbeeck J. and Van Aert S. (20150330). The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images. : Micron (Oxford, England : 1993).

MLA

Martinez G T, De Backer A, Rosenauer A, Verbeeck J and Van Aert S. The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images. : Micron (Oxford, England : 1993). 20150330.