Feedback based simultaneous correction of imaging artifacts due to geometrical and mechanical cross-talk and tip-sample stick in atomic force microscopy. [electronic resource]

By: Contributor(s): Producer: 20080108Description: 103706 p. digitalISSN:
  • 0034-6748
Subject(s): Online resources: In: The Review of scientific instruments vol. 78
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Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.

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